LEADER 02404nam 2200409 450 001 996280213703316 005 20230424140100.0 010 $a1-4799-7603-2 035 $a(CKB)4160000000000208 035 $a(NjHacI)994160000000000208 035 $a(EXLCZ)994160000000000208 100 $a20230424d2015 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$a2015 20th IEEE European Test Symposium (ETS) $eETS 2015 : May 25th-29th 2015, Cluj-Napoca, Romania /$fInstitute of Electrical and Electronics Engineers 210 1$aPiscataway, New Jersey :$cIEEE,$d2015. 215 $a1 online resource (211 pages) $cillustrations 311 $a1-4799-7604-0 330 $aETS15 is dedicated to presenting and discussing results, applications, emerging ideas and trends in the following topics Analog Test ATE Hardware and Software Board Test and Diagnosis Boundary Scan, BIST and Self Repair Current Based and Defect Based Test Delay and Performance Test Dependability and Functional Safety DfT Design for Manufacturing Diagnosis and Silicon Debug Economics of Test Emerging Technologies Failure Analysis Fault Modeling and Simulation Fault Tolerance GPU Test High Speed I O Test Low Power IC Test Memory Test and Repair MEMS Test Microprocessor Test Mixed Signal Test Multi Many core Processor Test Nanotechnology Test On line Test Power Issues in Test Reconfigurable System Test RF Test Security and Trust Issues in Test Sensor Test Signal Integrity Test SIP, Stacked, 3D IC Test SoC Test Soft Errors Standards in Test System Test Test compression Test Quality & Synthesis Thermal Issues in Test Validation and Verification Variability Issues in Test Yield Analysis. 517 $a2015 20th IEEE European Test Symposium 517 $aTest Symposium 606 $aAutomatic test equipment$vCongresses 606 $aElectronic digital computers$xCircuits$xTesting$vCongresses 606 $aIntegrated circuits$xTesting$vCongresses 615 0$aAutomatic test equipment 615 0$aElectronic digital computers$xCircuits$xTesting 615 0$aIntegrated circuits$xTesting 676 $a620.0044 801 0$bNjHacI 801 1$bNjHacl 906 $aPROCEEDING 912 $a996280213703316 996 $a2015 20th IEEE European Test Symposium (ETS)$92545102 997 $aUNISA LEADER 01324cam a2200313 i 4500 001 991000286599707536 008 020 $a8887467668 035 $ab12594854-39ule_inst 040 $aDip.to Lingue $bita 082 0 $a820.90 245 03$aLe riscritture del postmoderno:$bpercorsi angloamericani /$ca cura di Ornella De Zordo e Fiorenzo Fantaccini 260 $aBari :$bPalomar,$cc2002 300 $a430 p. ;$c21 cm 440 0$aPalomar Athenaeum.$pIntertesti ;$v26 504 $aContiene riferimenti bibliografici e indice 650 14$aLetteratura inglese$ySec20$xStoria e critica 650 14$aLetteratura americana$ySec.20$xStoria e critica 650 14$aPostmodernismo(letteratura)$zGran Bretagna 650 14$aPostmodernismo(letteratura)$zStati Uniti 700 1 $aDe Zordo, Ornella 700 1 $aFantaccini, Fiorenzo 907 $a.b12594854$b23-02-12$c04-02-04 912 $a991000286599707536 945 $aLE021 820.90 DEZ01.01$g1$i2020000014263$lle021$op$pE26.00$q-$rn$s- $t0$u0$v0$w0$x0$y.i14969956$z22-05-09 945 $aLE012 820.900 91 DEZ$g1$i2012000041851$lle012$o-$pE0.00$q-$rl$s- $t0$u6$v2$w6$x0$y.i13071014$z04-02-04 996 $aRiscritture del postmoderno$9277937 997 $aUNISALENTO 998 $ale020$ale012$b - - $cm$da $e-$fita$git $h3$i2