LEADER 01301nam  2200385   450 
001 996280069103316
005 20230814230356.0
010   $a1-5386-9466-2
035   $a(CKB)4100000007213033
035   $a(WaSeSS)IndRDA00121940
035   $a(EXLCZ)994100000007213033
100   $a20200416d2018      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$a2018 IEEE 27th Asian Test Symposium $e15-18 October 2018, Hefei, China /$fIEEE Computer Society
210  1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers,$d2018.
215   $a1 online resource (79 pages)
311   $a1-5386-9467-0 
606   $aElectronic digital computers$xTesting$xCircuits$vCongresses
606   $aElectronic circuits$xTesting$vCongresses
606   $aFault-tolerant computing$vCongresses
615  0$aElectronic digital computers$xTesting$xCircuits
615  0$aElectronic circuits$xTesting
615  0$aFault-tolerant computing
676   $a621.3815
712 02$aIEEE Computer Society,
801  0$bWaSeSS
801  1$bWaSeSS
906   $aPROCEEDING
912   $a996280069103316
996   $a2018 IEEE 27th Asian Test Symposium$92528000
997   $aUNISA