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035   $a(CONSER)--2010203573
035   $a(EXLCZ)992320000000021149
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101 0 $aeng
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181   $ctxt$2rdacontent
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200 10$aIEEE International Conference on Computational Intelligence for Measurement Systems and Applications $e[proceedings]
210   $aPiscataway, N.J. $cInstitute of Electrical and Electronics Engineers
311   $a2159-1547 
517 3 $aInternational Conference on Computational Intelligence for Measurement Systems and Applications
517 3 $aComputational intelligence for measurement systems and applications
517 3 $aCIMSA proceedings
531 0 $aIEEE Int. Conf. Comput. Intell. Meas. Syst. Appli.
606   $aComputational intelligence$xIndustrial applications$vCongresses
606   $aNeural networks (Computer science)$vCongresses
606   $aFuzzy systems$vCongresses
606   $aSoft computing$vCongresses
606   $aAutomatic control$xData processing$vCongresses
606   $aMeasurement$vCongresses
606   $aAutomatic control$xData processing$2fast$3(OCoLC)fst00822705
606   $aComputational intelligence$xIndustrial applications$2fast$3(OCoLC)fst00871996
606   $aFuzzy systems$2fast$3(OCoLC)fst00936814
606   $aMeasurement$2fast$3(OCoLC)fst01715944
606   $aNeural networks (Computer science)$2fast$3(OCoLC)fst01036260
606   $aSoft computing$2fast$3(OCoLC)fst01124115
608   $aConference papers and proceedings.$2fast
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712 02$aInstitute of Electrical and Electronics Engineers.
906   $aCONFERENCE
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996   $aIEEE International Conference on Computational Intelligence for Measurement Systems and Applications$91886343
997   $aUNISA