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011   $a2377-7966
035   $a(OCoLC)57375271
035   $a(CKB)111088195290232
035   $a(CONSER)--2015201805
035   $a(EXLCZ)99111088195290232
100   $a20050106b19962010  ---            a
101 0 $aeng
135   $aurcn||||||m||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aProceedings /$fIEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : (DFT)
210  1$aLos Alamitos, Calif. :$cIEEE Computer Society Press,$d1996-2010.
210 31$aLos Alamitos, Calif. :$cIEEE Computer Society
215   $a15 volumes
311   $a1550-5774 
606   $aIntegrated circuits$xVery large scale integration$xDesign and construction$vCongresses
606   $aIntegrated circuits$xFault tolerance$vCongresses
606   $aIntegrated circuits$xFault tolerance$2fast$3(OCoLC)fst00975563
606   $aIntegrated circuits$xVery large scale integration$xDesign and construction$2fast$3(OCoLC)fst00975610
608   $aElectronic journals.
608   $aConference papers and proceedings.$2fast
608   $aPeriodicals.$2fast
615  0$aIntegrated circuits$xVery large scale integration$xDesign and construction
615  0$aIntegrated circuits$xFault tolerance
615  7$aIntegrated circuits$xFault tolerance.
615  7$aIntegrated circuits$xVery large scale integration$xDesign and construction.
676   $a621.39/5
712 02$aIEEE Computer Society.
906   $aCONFERENCE
912   $a996279994503316
996   $aProceedings$957126
997   $aUNISA