LEADER 01438nam  2200385   450 
001 996279928603316
005 20230814224256.0
010   $a1-5386-4929-2
035   $a(CKB)4100000006459870
035   $a(WaSeSS)IndRDA00122316
035   $a(EXLCZ)994100000006459870
100   $a20200424d2018      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$a2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits $e16-19 July 2018, Singapore /$fInstitute of Electrical and Electronics Engineers
210  1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers,$d2018.
215   $a1 online resource (146 pages)
311   $a1-5386-4930-6 
606   $aIntegrated circuits$xReliability$vCongresses
606   $aIntegrated circuits$xTesting$vCongresses
606   $aSemiconductors$xFailures$vCongresses
615  0$aIntegrated circuits$xReliability
615  0$aIntegrated circuits$xTesting
615  0$aSemiconductors$xFailures
676   $a621.3815
712 02$aInstitute of Electrical and Electronics Engineers,
801  0$bWaSeSS
801  1$bWaSeSS
906   $aPROCEEDING
912   $a996279928603316
996   $a2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits$92539392
997   $aUNISA