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181   $ctxt$2rdacontent
182   $cc$2rdamedia
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200 10$aProceedings /$fIEEE International On-Line Testing Symposium
210   $aLos Alamitos, Calif. $cIEEE Computer Society$dİ2003-
300   $aTitle from PDF of original t.p. (IEEE Xplore, viewed May 24, 2007).
311   $a1942-9398 
517 3 $aIOLTS
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606   $aElectronic circuits$xTesting$vCongresses
606   $aOnline data processing$vCongresses
606   $aElectronic circuit design$vCongresses
606   $aError-correcting codes (Information theory)$vCongresses
606   $aElectronic circuit design$2fast$3(OCoLC)fst00906862
606   $aElectronic circuits$xTesting$2fast$3(OCoLC)fst00906898
606   $aError-correcting codes (Information theory)$2fast$3(OCoLC)fst00915036
606   $aOnline data processing$2fast$3(OCoLC)fst01045942
608   $aPeriodicals.$2fast
608   $aConference papers and proceedings.$2fast
615  0$aElectronic circuits$xTesting
615  0$aOnline data processing
615  0$aElectronic circuit design
615  0$aError-correcting codes (Information theory)
615  7$aElectronic circuit design.
615  7$aElectronic circuits$xTesting.
615  7$aError-correcting codes (Information theory)
615  7$aOnline data processing.
676   $a621
712 02$aInstitute of Electrical and Electronics Engineers.
712 02$aIEEE Computer Society.$bTechnical Council on Test Technology.
906   $aCONFERENCE
912   $a996279895103316
996   $aProceedings$957126
997   $aUNISA