LEADER 00811nam0 2200253 450 001 000024708 005 20090319140229.0 100 $a20090319d1969----km-y0itay50------ba 101 0 $aeng 102 $aGB 105 $ay-------001yy 200 1 $aEconomics$eBritain and the EEC$fHarry G. Johnson ... [et al.]$gedited by M. A. G. van Meerhaeghe 210 $aLondon Harlow$cLongmans$d1969 215 $aVIII, 111 p.$d22 cm 500 10$aEconomics$955292 610 1 $aInghilterra$aCondizioni economiche 610 1 $aGalles$aCondizioni economiche 702 1$aMeerhaeghe,$bMarcel Alfons Gilbert : van$4070 702 1$aJohnson,$bHarry G. 801 0$aIT$bUNIPARTHENOPE$c20090319$gRICA$2UNIMARC 912 $a000024708 951 $a424/16$b2729$cNAVA2$d2009 996 $aEconomics$955292 997 $aUNIPARTHENOPE LEADER 01168nam a2200289 i 4500 001 991001777669707536 005 20020507151623.0 008 000719s1990 it ||| | ita 020 $a8813170874 035 $ab11562663-39ule_inst 035 $aLE02725054$9ExL 040 $aDip.to Studi Giuridici$bita 082 0 $a340.972 084 $aCM-XIV/B 100 1 $aJayme, Erik$0239699 245 13$aLa compravendita internazionale di beni mobili nei rapporti tra Italia e Germania /$ca cura di Erik Jayme ; con la collaborazione di Cristiana Fioravanti e Sabine Isenburg Epple 260 $aPadova :$bCEDAM,$c1990 300 $aXII, 219 p. ;$c23 cm. 650 4$aBeni mobili - Vendita$xDiritto internazionale privato 700 1 $aFioravanti, Cristiana 700 1 $aIsenburg Epple, Sabine 907 $a.b11562663$b21-09-06$c02-07-02 912 $a991001777669707536 945 $aLE027 CM-XIV/B 24$g1$iLE027I-1390$lle027$o-$pE0.00$q-$rl$s- $t0$u0$v0$w0$x0$y.i11765458$z02-07-02 996 $aCompravendita internazionale di beni mobili nei rapporti tra Italia e Germania$9895495 997 $aUNISALENTO 998 $ale027$b01-01-00$cm$da $e-$fita$git $h3$i1 LEADER 01523oam 2200481I 450 001 9910712857703321 005 20200129093941.0 035 $a(CKB)5470000002497605 035 $a(OCoLC)1105632604 035 $a(EXLCZ)995470000002497605 100 $a20190625d1920 ua 0 101 0 $aeng 135 $aurbn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aDuralumin /$fby E. Unger and E. Schmidt 210 1$a[Washington, D.C.] :$cNational Advisory Committee for Aeronautics,$d1920. 215 $a1 online resource (10 pages, 3 unnumbered pages) $cillustrations 225 1 $aTechnical notes / National Advisory Committee for Aeronautics ;$vNo. 8 300 $a"Translated from Technische Berichte Vol. III - Section 6 by Starr Truscott." 300 $a"July, 1920." 300 $aNo Federal Depository Library Program (FDLP) item number. 606 $aAluminum alloys 606 $aDuralumin 606 $aAluminum alloys$2fast 606 $aDuralumin$2fast 615 0$aAluminum alloys. 615 0$aDuralumin. 615 7$aAluminum alloys. 615 7$aDuralumin. 700 $aUnger$b E$g(Eliezer),$01392341 702 $aSchmidt$b E. 712 02$aUnited States.$bNational Advisory Committee for Aeronautics, 801 0$bTRAAL 801 1$bTRAAL 801 2$bTRAAL 801 2$bOCLCO 801 2$bGPO 906 $aBOOK 912 $a9910712857703321 996 $aDuralumin$93446914 997 $aUNINA LEADER 01903nam 2200373 450 001 996279876203316 005 20231206173939.0 010 $a0-7381-1023-X 024 70$a10.1109/IEEESTD.1989.94589 035 $a(CKB)3780000000089148 035 $a(NjHacI)993780000000089148 035 $a(EXLCZ)993780000000089148 100 $a20231206d1989 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aANSI/IEEE Std 120-1989 $eIEEE Master Test Guide for Electrical Measurements in Power Circuits /$fPower System Instrumentation and Measurements of the IEEE Power and Energy Society 210 1$aPiscataway :$cIEEE,$d1989. 215 $a1 online resource (125 pages) 330 $aInstructions are given for measuring electrical quantities that are commonly needed to determine the performance characteristics of electric machinery and equipment. Methods are given for measuring voltage, current, power, energy, power factor, frequency, impedance, and magnetic quantities, with either analog or digital indicating or integrating instruments, in DC or AC rotating machines, transformers, induction apparatus, arc and resistance heating equipment, mercury arc, thermionic, or solid-state rectifiers and inverters. Ancillary instruments and equipment are discussed. Computer-based techniques and the use of optical fibers in instrumentation are considered. 517 $aANSI/IEEE Std 120-1989: IEEE Master Test Guide for Electrical Measurements in Power Circuits 606 $aElectric circuits$xTesting 606 $aElectronic measurements 615 0$aElectric circuits$xTesting. 615 0$aElectronic measurements. 676 $a621.3192 801 0$bNjHacI 801 1$bNjHacl 906 $aDOCUMENT 912 $a996279876203316 996 $aANSI$92072434 997 $aUNISA LEADER 05533nam 22008655 450 001 9910373924903321 005 20250610110030.0 010 $a3-030-29454-4 024 7 $a10.1007/978-3-030-29454-0 035 $a(CKB)4900000000504985 035 $a(DE-He213)978-3-030-29454-0 035 $a(MiAaPQ)EBC6005117 035 $a(iGPub)SPNA0063191 035 $a(PPN)242843042 035 $a(MiAaPQ)EBC6005072 035 $a(MiAaPQ)EBC29092635 035 $a(EXLCZ)994900000000504985 100 $a20200101d2019 u| 0 101 0 $aeng 135 $aurnn|008mamaa 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 12$aA Practical Guide to Surface Metrology /$fby Michael Quinten 205 $a1st ed. 2019. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2019. 215 $a1 online resource (XXV, 230 p. 156 illus., 100 illus. in color.) 225 1 $aSpringer Series in Measurement Science and Technology,$x2198-7807 311 08$a3-030-29453-6 320 $aIncludes bibliographical references and index. 327 $aPreface -- Introduction to Surfaces and Surface Metrology -- Tactile Surface Metrology -- Capacitive And Inductive Surface Metrology -- Optical Surface Metrology- Physical Basics -- Optical Surface Metrology - Methods -- Imaging Methods - Multisensor - Systems - A Versatile Approach To Surface Metrology -- Appendix -- Index. 330 $aThis book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context. Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors). The book provides: Overview of the working principles Description of advantages and disadvantages Currently achievable numbers for resolutions, repeatability, and reproducibility Examples of real-world applications A final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization of surfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering. 410 0$aSpringer Series in Measurement Science and Technology,$x2198-7807 606 $aPhysical measurements 606 $aMeasurement 606 $aMaterials science 606 $aSurfaces (Physics) 606 $aInterfaces (Physical sciences) 606 $aThin films 606 $aMaterials?Surfaces 606 $aEngineering?Materials 606 $aLasers 606 $aPhotonics 606 $aMeasurement Science and Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/P31040 606 $aCharacterization and Evaluation of Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z17000 606 $aSurface and Interface Science, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/P25160 606 $aSurfaces and Interfaces, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/Z19000 606 $aMaterials Engineering$3https://scigraph.springernature.com/ontologies/product-market-codes/T28000 606 $aOptics, Lasers, Photonics, Optical Devices$3https://scigraph.springernature.com/ontologies/product-market-codes/P31030 615 0$aPhysical measurements. 615 0$aMeasurement. 615 0$aMaterials science. 615 0$aSurfaces (Physics) 615 0$aInterfaces (Physical sciences) 615 0$aThin films. 615 0$aMaterials?Surfaces. 615 0$aEngineering?Materials. 615 0$aLasers. 615 0$aPhotonics. 615 14$aMeasurement Science and Instrumentation. 615 24$aCharacterization and Evaluation of Materials. 615 24$aSurface and Interface Science, Thin Films. 615 24$aSurfaces and Interfaces, Thin Films. 615 24$aMaterials Engineering. 615 24$aOptics, Lasers, Photonics, Optical Devices. 676 $a681.25 676 $a681.25 700 $aQuinten$b Michael$4aut$4http://id.loc.gov/vocabulary/relators/aut$021849 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910373924903321 996 $aA Practical Guide to Surface Metrology$92509551 997 $aUNINA