LEADER 01066nam 2200337 450 001 996279837203316 005 20180228105704.0 035 $a(CKB)3710000001361539 035 $a(WaSeSS)IndRDA00092848 035 $a(EXLCZ)993710000001361539 100 $a20180228h20171988 || | 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aSymposium on Antenna Technology and Applied Electromagnetics $e1988 conference proceedings : Winnipeg, Canada, August 10-12, 1988 210 1$aNew York :$cIEEE,$d2017. 210 4$dc1988 215 $a1 online resource (460 pages) 311 $a0-9692563-1-0 606 $aAntennas (Electronics)$vCongresses 606 $aElectromagnetic waves$vCongresses 615 0$aAntennas (Electronics) 615 0$aElectromagnetic waves 801 0$bWaSeSS 801 1$bWaSeSS 906 $aBOOK 912 $a996279837203316 996 $aSymposium on Antenna Technology and Applied Electromagnetics$92496047 997 $aUNISA LEADER 01687aam 2200397I 450 001 9910710237303321 005 20160309011335.0 024 8 $aGOVPUB-C13-080dce382a37cf77728701c0fe434694 035 $a(CKB)5470000002476915 035 $a(OCoLC)944187945 035 $a(EXLCZ)995470000002476915 100 $a20160309d1980 ua 0 101 0 $aeng 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aDevelopment of test structures for characterization of the fabrication and performance of radiation-hardened charge-coupled device (CCD) imagers $eannual report, December 1, 1978 to November 30, 1979 /$fG. P. Carver; S. Rubin 210 1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1980. 215 $a1 online resource 225 1 $aNBSIR ;$v80-2000 300 $a1980. 300 $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes. 300 $aTitle from PDF title page. 320 $aIncludes bibliographical references. 517 $aDevelopment of test structures for characterization of the fabrication and performance of radiation-hardened charge-coupled device 700 $aCarver$b G. P$01385516 701 $aCarver$b G. P$01385516 701 $aRubin$b S$0110507 712 02$aUnited States.$bNational Bureau of Standards. 801 0$bNBS 801 1$bNBS 801 2$bGPO 906 $aBOOK 912 $a9910710237303321 996 $aDevelopment of test structures for characterization of the fabrication and performance of radiation-hardened charge-coupled device (CCD) imagers$93533064 997 $aUNINA