LEADER 00972oam  2200337zu 450 
001 996279660503316
005 20210807002702.0
010   $a1-4673-6429-0
010   $a1-4673-6428-2
035   $a(CKB)3280000000025825
035   $a(SSID)ssj0001106966
035   $a(PQKBManifestationID)12414752
035   $a(PQKBTitleCode)TC0001106966
035   $a(PQKBWorkID)11074263
035   $a(PQKB)10785704
035   $a(EXLCZ)993280000000025825
100   $a20160829d2013      uy              
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$a2013 IEEE/CPMT 29th Semiconductor Thermal Measurement and Management Symposium (SemiTherm)
210 31$a[Place of publication not identified]$cIEEE$d2013
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a1-4673-6427-4 
702   $aieee
801  0$bPQKB
906   $aPROCEEDING
912   $a996279660503316
996   $a2013 IEEE$92088087
997   $aUNISA