LEADER 01529nam 2200385 450 001 996279606103316 005 20231209090610.0 010 $a1-5044-4567-8 024 7 $a10.1109/IEEESTD.2018.8337144 035 $a(CKB)4100000005061679 035 $a(NjHacI)994100000005061679 035 $a(EXLCZ)994100000005061679 100 $a20231209d2018 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aIEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007) $eIEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description /$fInstitute of Electrical and Electronics Engineers 210 1$aNew York, New York :$cIEEE,$d2018. 215 $a1 online resource (747 pages) 330 $aAn exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard. 517 $a1671.3-2017 - IEEE Standard for Automatic Test Markup Language 517 $aIEEE Std 1671.3-2017 606 $aDigital electronics$xStandards 606 $aStandards, Engineering 615 0$aDigital electronics$xStandards. 615 0$aStandards, Engineering. 676 $a621.3 801 0$bNjHacI 801 1$bNjHacl 906 $aDOCUMENT 912 $a996279606103316 996 $aIEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007)$93647570 997 $aUNISA