LEADER 02498nam 2200385 450 001 996279576703316 005 20231216040540.0 010 $a0-7381-3520-8 024 7 $a10.1109/IEEESTD.2003.7174934 035 $a(CKB)3780000000093160 035 $a(NjHacI)993780000000093160 035 $a(EXLCZ)993780000000093160 100 $a20231216d2002 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aIEEE Std C95.3-2002 (Revision of IEEE Std C95.3-1991) $eIEEE Recommended Practice for Measurements and Computations of Radio Frequency Electromagnetic Fields With Respect to Human Exposure to Such Fields,100 kHz-300 GHz /$fInstitute of Electrical and Electronics Engineers 210 1$a[Place of publication not identified] :$cIEEE,$d2002. 215 $a1 online resource (126 pages) 330 $aTechniques and instrumentation for the measurement and computation of potentially hazardous electromagnetic (EM) fields both in the near field and the far field of the electromagnetic source are specified.The specifications previously set forth in IEEE Std C95.3 -1991 are extended and combined. Leakage and near-field measurements and a description of the concepts, techniques, and instruments that can be applied to the measurement of specific absorption rate (SAR) or the electric field strength in organisms (including humans) and phantoms exposed to electromagnetic fields are included.Below 100 MHz, the current flowing through the body to ground is measurable and can be used to determine the SAR and, therefore, a brief treatment of low- frequency body current measurement is included. The "IEEE Get Program" grants public access to view and download individual PDFs of select standards at no charge. Visit http://standards.ieee.org/about/get/index.html for details. 517 $aIEEE Std C95.3-2002 (Revision of IEEE Std C95.3-1991): IEEE Recommended Practice for Measurements and Computations of Radio Frequency Electromagnetic Fields With Respect to Human Exposure to Such Fields,100 kHz-300 GHz 517 $aIEEE Std C95.3-2002 606 $aIonization 606 $aIonization of gases 615 0$aIonization. 615 0$aIonization of gases. 676 $a537.532 801 0$bNjHacI 801 1$bNjHacl 906 $aDOCUMENT 912 $a996279576703316 996 $aIEEE Std C95.3-2002 (Revision of IEEE Std C95.3-1991)$92576640 997 $aUNISA