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024 7 $a10.1109/IEEESTD.2013.6617654
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100   $a20231208d2013      uy             0
101 0 $aeng
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181   $ctxt$2rdacontent
182   $cc$2rdamedia
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200 10$aIEC 62860-1 $e2013(E) IEEE Std. 1620.1-2006 : Test methods for the characterization of organic transistor-based ring oscillators /$fInstitute of Electrical and Electronics Engineers
210  1$aPiscataway, New Jersey :$cIEEE,$d2013.
215   $a1 online resource (26 pages)
330   $aRecommended methods and standardized reporting practices for electricalcharacterization of printed and organic ring oscillators are covered. Due to the nature of printedand organic circuits, significant measurement errors can be introduced if the electricalcharacterization design-of-experiment is not properly addressed. This standard describes themost common sources of measurement error, particularly for high-impedance electricalmeasurements commonly required for printed and organic ring oscillators. This standard alsogives recommended practices in order to minimize and/or characterize the effect of measurementartifacts and other sources of error encountered while measuring printed and organic ringoscillators.
517   $aIEC 62860-1:2013(E) IEEE Std. 1620.1-2006: IEC/IEEE Test methods for the characterization of organic transistor-based ring oscillators
517   $aIEC 62860-1
606   $aOscillators, Electric
615  0$aOscillators, Electric.
676   $a621.381533
801  0$bNjHacI
801  1$bNjHacl
906   $aDOCUMENT
912   $a996279341803316
996   $aIEC 62860-1$93646209
997   $aUNISA