LEADER 01506nam  2200349   450 
001 996279341703316
005 20171019095932.0
010   $a0-7381-5721-X
035   $a(CKB)2670000000414801
035   $a(WaSeSS)IndRDA00079239
035   $a(NjHacI)992670000000414801
035   $a(EXLCZ)992670000000414801
100   $a20171019d2007      ||             |
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aStandard test interface language (STIL) for digital test vector data
210  1$aNew York :$cIEEE,$d2007.
215   $a1 online resource (148 pages)
311   $a2-8318-9337-2 
330   $aStandard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
606   $aIntegrated circuits$xTesting$xStandards
615  0$aIntegrated circuits$xTesting$xStandards.
676   $a621.38150287
801  0$bWaSeSS
801  1$bWaSeSS
906   $aDOCUMENT
912   $a996279341703316
996   $aStandard test interface language (STIL) for digital test vector data$92580956
997   $aUNISA