LEADER 01172nam a2200337 i 4500 001 991000944529707536 005 20020507104211.0 008 000403s1990 us ||| | eng 020 $a0201304503$c109000 035 $ab10151734-39ule_inst 035 $aLE00639544$9ExL 040 $aDip.to Fisica$bita 082 04$a530.1/43$220 084 $a53.3.11 084 $aLC QC174.45 100 1 $aRamond, Pierre$048767 245 10$aField theory :$ba modern primer /$cPierre Ramond 250 $a2nd ed., rev. print. 260 $aBoulder, Colo. :$bWestview Press,$cc1990 300 $axix, 329 p. :$bill. ;$c23 cm 490 0 $aFrontiers in physics / David Pines ;$v74 500 $aIncludes bibliographical references (p. 321-325) and index 650 4$aIntegrals, Path 650 4$aPerturbation (Quantum dynamics) 650 4$aQuantum field theory 907 $a.b10151734$b15-01-20$c27-06-02 912 $a991000944529707536 945 $aLE006 53.3.11 RAM$g1$i2006000179911$lle006$o-$pE0.00$q-$rl$s- $t0$u3$v0$w3$x0$y.i10181751$z27-06-02 996 $aField theory$9187691 997 $aUNISALENTO 998 $ale006$b01-01-00$cm$da $e-$feng$gus $h0$i1 LEADER 01277nam 2200385 450 001 996279341603316 005 20171018112550.0 010 $a0-7381-5724-4 035 $a(CKB)2670000000414800 035 $a(WaSeSS)IndRDA00079143 035 $a(NjHacI)992670000000414800 035 $a(EXLCZ)992670000000414800 100 $a20171018d2007 || | 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aIEC standard testability method for embedded core-based integrated circuits 210 1$aNew York :$cIEEE,$d2007. 215 $a1 online resource (349 pages) 311 $a2-8318-9481-6 606 $aEmbedded computer systems$xTesting$xStandards 606 $aSystems on a chip$xTesting$xStandards 606 $aIntegrated circuits$xTesting$xStandards 615 0$aEmbedded computer systems$xTesting$xStandards. 615 0$aSystems on a chip$xTesting$xStandards. 615 0$aIntegrated circuits$xTesting$xStandards. 676 $a621.38173 801 0$bWaSeSS 801 1$bWaSeSS 906 $aDOCUMENT 912 $a996279341603316 996 $aIEC standard testability method for embedded core-based integrated circuits$92575740 997 $aUNISA