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200 10$aIEEE Std 1505.1-2008 $eIEEE Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 /$fIEEE
210  1$aNew York :$cIEEE,$d[2008]
215   $a1 online resource
330   $aThis trial-use standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).
517   $aIEEE Std 1505.1-2008 (Full-Use): IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
606   $aElectric connectors
615  0$aElectric connectors.
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