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200 10$aIEEE Std 1636.2-2010 (Full_Use) /$fInstitute of Electrical and Electronics Engineers
210  1$aNew York :$cIEEE,$d2013.
215   $a1 online resource (viii, 66 pages) $cillustrations
330   $aInteroperability between components of automatic test systems (ATS) is promoted and facilitated. The standard facilitates the capture of maintenance action information (MAI) associated with the removal, repair, and replacement of a particular system component (e.g., unit(s) under test) in order to maintain/support that particular operational system. The MAI schema becomes a class of information that can be used within the SIMICA family of standards. The exchange format utilizes the XML formats. Keywords: automated test system (ATS), eXtensible markup language (XML), IEEE 1636.2, maintenance action information (MAI), Software Interface for Maintenance Information Collection and Analysis (SIMICA), XML schema.
517   $a1636.2-2010 - IEEE Standard for Software Interface for Maintenance Information Collection and Analysis 
517   $aIEEE Std 1636.2-2010 (Full_Use): IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML)
517   $aIEEE Standard for Software Interface for Maintenance Information Collection and Analysis 
517   $aIEEE Std 1636.2-2010 
606   $aAutomatic test equipment
606   $aDigital electronics
615  0$aAutomatic test equipment.
615  0$aDigital electronics.
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