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101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
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200 10$aIEEE trial-use standard for testability and diagnosability characteristics and metrics /$fIEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems, Institute of Electrical and Electronics Engineers, IEEE-SA Standards Board
210  1$aNew York, N.Y. :$cInstitute of Electrical and Electronics Engineers,$d2005.
215   $a1 online resource (v, 35 pages)
311   $a0-7381-4493-2 
330   $aThis standard was developed to provide standard, unambiguous definitions of testability diagnosability metrics and characteristics. It builds on fundamental definitions derived from elements in formal information models related to test and diagnosis defined in IEEE Std 1232-2002.
517   $aIEEE Std 1522-2004: IEEE Trial-Use Standard for Testability and Diagnosability Characteristics and Metrics
606   $aArtificial intelligence$xStandards
606   $aExpert systems (Computer science)$xStandards
615  0$aArtificial intelligence$xStandards.
615  0$aExpert systems (Computer science)$xStandards.
676   $a006.3
712 02$aInstitute of Electrical and Electronics Engineers,
712 02$aIEEE-SA Standards Board,
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906   $aDOCUMENT
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996   $aIEEE trial-use standard for testability and diagnosability characteristics and metrics$93574601
997   $aUNISA