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200 10$a2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings
210 31$a[Place of publication not identified]$cIEEE Computer Society$d2000
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-0637-2 
606   $aIntegrated circuits$xDefects$vCongresses
606   $aIddq testing$vCongresses
606   $aMetal oxide semiconductors, Complementary$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aElectrical Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aIntegrated circuits$xDefects
615  0$aIddq testing
615  0$aMetal oxide semiconductors, Complementary
615  7$aElectrical & Computer Engineering
615  7$aElectrical Engineering
615  7$aEngineering & Applied Sciences
676   $a621.3815
702   $aMenon$b Sankaran M
702   $aSachdev$b Manoj
702   $aMalaiya$b Yashwant K
712 02$aIEEE Computer Society Test Technology Technical Committee
712 12$aIEEE International Workshop on Defect Based Testing
801  0$bPQKB
906   $aPROCEEDING
912   $a996218751103316
996   $a2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings$92353611
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