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101 0 $aeng
181   $ctxt
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183   $acr
200 10$aThird IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
210 31$a[Place of publication not identified]$cIEEE Computer Society$d2006
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-2500-8 
606   $aIntegrated circuits$xTesting$vCongresses
606   $aIntegrated circuits$xDesign and construction$vCongresses
606   $aMicroelectronics$xDesign$vCongresses
606   $aMicroelectronics$xTesting$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aElectrical Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aIntegrated circuits$xTesting
615  0$aIntegrated circuits$xDesign and construction
615  0$aMicroelectronics$xDesign
615  0$aMicroelectronics$xTesting
615  7$aElectrical & Computer Engineering
615  7$aElectrical Engineering
615  7$aEngineering & Applied Sciences
676   $a621.381
702   $aGirard$b Patrick
702   $aOsseiran$b Adam
702   $aChew$b Moi-Tin
712 02$aIEEE Computer Society Technical Council on Test Technology.
712 02$aIEEE Malaysia Section
712 12$aIEEE International Workshop on Electronic Design, Test and Applications
801  0$bPQKB
906   $aPROCEEDING
912   $a996218384203316
996   $aThird IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia$92312742
997   $aUNISA