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181   $ctxt
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200 10$aProceedings, International Test Conference 1999
210 31$a[Place of publication not identified]$cInternational Test Conference$d1999
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-5753-1 
606   $aIntegrated circuits$xTesting$vCongresses
606   $aElectronic digital computers$xCircuits$xTesting$vCongresses
606   $aEmbedded computer systems$xTesting$vCongresses
606   $aMicroprocessors$xTesting$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aElectrical Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aIntegrated circuits$xTesting
615  0$aElectronic digital computers$xCircuits$xTesting
615  0$aEmbedded computer systems$xTesting
615  0$aMicroprocessors$xTesting
615  7$aElectrical & Computer Engineering
615  7$aElectrical Engineering
615  7$aEngineering & Applied Sciences
676   $a621.3815/48
712 02$aIEEE Computer Society
801  0$bPQKB
906   $aPROCEEDING
912   $a996218046903316
996   $aProceedings, International Test Conference 1999$92380645
997   $aUNISA