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101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$aFourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California
210 31$a[Place of publication not identified]$cIEEE Computer Society$d2003
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-1881-8 
606   $aIntegrated circuits$xVery large scale integration$xReliability$vCongresses
606   $aIntegrated circuits$xVery large scale integration$xDesign and construction$vCongresses
606   $aIntegrated circuits$xComputer-aided design$xVery large scale integration$vCongresses
606   $aIntegrated circuits$xVery large scale integration$xQuality control$xTesting$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIntegrated circuits$xVery large scale integration$xReliability
615  0$aIntegrated circuits$xVery large scale integration$xDesign and construction
615  0$aIntegrated circuits$xComputer-aided design$xVery large scale integration
615  0$aIntegrated circuits$xVery large scale integration$xQuality control$xTesting
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.39/5
712 02$aIEEE Electron Devices Society
712 12$aInternational Symposium on Quality Electronic Design
801  0$bPQKB
906   $aPROCEEDING
912   $a996217941903316
996   $aFourth International Symposium on Quality Electronic Design : proceedings : 24-26 March, 2003, San Jose, California$92385911
997   $aUNISA