LEADER 03051oam 2200865zu 450 001 996217795703316 005 20221206174800.0 035 $a(CKB)111026746747554 035 $a(SSID)ssj0000393652 035 $a(PQKBManifestationID)12144753 035 $a(PQKBTitleCode)TC0000393652 035 $a(PQKBWorkID)10373476 035 $a(PQKB)11738064 035 $a(EXLCZ)99111026746747554 100 $a20160829d1998 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$aWorkshop on Biomedical Image Analysis : proceedings, June 26-27, 1998, Santa Barbara, California 210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d1998 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-8186-8460-7 606 $aImaging systems in medicine$xCongresses 606 $aImage processing$xCongresses 606 $aDatabase management$xCongresses 606 $aImage Processing, Computer-Assisted 606 $aData Interpretation, Statistical 606 $aStatistics as Topic 606 $aDecision Support Techniques 606 $aComputing Methodologies 606 $aInformation Science 606 $aHealth Care Evaluation Mechanisms 606 $aMedical Informatics Applications 606 $aInvestigative Techniques 606 $aEpidemiologic Methods 606 $aPublic Health 606 $aTherapeutics 606 $aQuality of Health Care 606 $aMedical Informatics 606 $aHealth Care Quality, Access, and Evaluation 606 $aEnvironment and Public Health 606 $aHealth Care 606 $aBiomedical Engineering$2HILCC 606 $aHealth & Biological Sciences$2HILCC 615 0$aImaging systems in medicine$xCongresses 615 0$aImage processing$xCongresses 615 0$aDatabase management$xCongresses 615 2$aImage Processing, Computer-Assisted 615 2$aData Interpretation, Statistical 615 2$aStatistics as Topic 615 2$aDecision Support Techniques 615 2$aComputing Methodologies 615 2$aInformation Science 615 2$aHealth Care Evaluation Mechanisms 615 2$aMedical Informatics Applications 615 2$aInvestigative Techniques 615 2$aEpidemiologic Methods 615 2$aPublic Health 615 2$aTherapeutics 615 2$aQuality of Health Care 615 2$aMedical Informatics 615 2$aHealth Care Quality, Access, and Evaluation 615 2$aEnvironment and Public Health 615 2$aHealth Care 615 7$aBiomedical Engineering 615 7$aHealth & Biological Sciences 676 $a610/.28 702 $aVemuri$b Baba C 712 02$aIEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence. 801 0$bPQKB 906 $aPROCEEDING 912 $a996217795703316 996 $aWorkshop on Biomedical Image Analysis : proceedings, June 26-27, 1998, Santa Barbara, California$92356716 997 $aUNISA LEADER 06075nam 2200769 a 450 001 9910822805803321 005 20240516061144.0 010 $a1-119-97990-0 010 $a1-283-20457-6 010 $a9786613204578 010 $a1-119-97884-X 010 $a1-119-97885-8 035 $a(CKB)2550000000043053 035 $a(EBL)693217 035 $a(OCoLC)751695083 035 $a(SSID)ssj0000529387 035 $a(PQKBManifestationID)12200145 035 $a(PQKBTitleCode)TC0000529387 035 $a(PQKBWorkID)10552903 035 $a(PQKB)11124748 035 $a(MiAaPQ)EBC693217 035 $a(Au-PeEL)EBL693217 035 $a(CaPaEBR)ebr10488537 035 $a(CaONFJC)MIL320457 035 $a(EXLCZ)992550000000043053 100 $a20110510d2011 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aAberration-corrected analytical transmission electron microscopy /$fedited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks 205 $a1st ed. 210 $aHoboken, N.J. $cWiley$d2011 215 $a1 online resource (306 p.) 225 1 $aRMS - Royal Microscopical Society 300 $aDescription based upon print version of record 311 $a0-470-51851-0 320 $aIncludes bibliographical references and index. 327 $aAberration-Corrected Analytical Transmission Electron Microscopy; Contents; List of Contributors; Preface; 1 General Introduction to Transmission Electron Microscopy (TEM); 1.1 What TEM Offers; 1.2 Electron Scattering; 1.2.1 Elastic Scattering; 1.2.2 Inelastic Scattering; 1.3 Signals which could be Collected; 1.4 Image Computing; 1.4.1 Image Processing; 1.4.2 Image Simulation; 1.5 Requirements of a Specimen; 1.6 STEM Versus CTEM; 1.7 Two Dimensional and Three Dimensional Information; 2 Introduction to Electron Optics; 2.1 Revision of Microscopy with Visible Light and Electrons 327 $a2.2 Fresnel and Fraunhofer Diffraction2.3 Image Resolution; 2.4 Electron Lenses; 2.4.1 Electron Trajectories; 2.4.2 Aberrations; 2.5 Electron Sources; 2.6 Probe Forming Optics and Apertures; 2.7 SEM, TEM and STEM; 3 Development of STEM; 3.1 Introduction: Structural and Analytical Information in Electron Microscopy; 3.2 The Crewe Revolution: How STEM Solves the Information Problem; 3.3 Electron Optical Simplicity of STEM; 3.4 The Signal Freedom of STEM; 3.4.1 Bright-Field Detector (Phase Contrast, Diffraction Contrast); 3.4.2 ADF, HAADF; 3.4.3 Nanodiffraction; 3.4.4 EELS; 3.4.5 EDX 327 $a3.4.6 Other Techniques3.5 Beam Damage and Beam Writing; 3.6 Correction of Spherical Aberration; 3.7 What does the Future Hold?; 4 Lens Aberrations: Diagnosis and Correction; 4.1 Introduction; 4.2 Geometric Lens Aberrations and Their Classification; 4.3 Spherical Aberration-Correctors; 4.3.1 Quadrupole-Octupole Corrector; 4.3.2 Hexapole Corrector; 4.3.3 Parasitic Aberrations; 4.4 Getting Around Chromatic Aberrations; 4.5 Diagnosing Lens Aberrations; 4.5.1 Image-based Methods; 4.5.2 Ronchigram-based Methods; 4.5.3 Precision Needed; 4.6 Fifth Order Aberration-Correction; 4.7 Conclusions 327 $a5 Theory and Simulations of STEM Imaging5.1 Introduction; 5.2 Z-Contrast Imaging of Single Atoms; 5.3 STEM Imaging Of Crystalline Materials; 5.3.1 Bright-field Imaging and Phase Contrast; 5.3.2 Annular Dark-field Imaging; 5.4 Incoherent Imaging with Dynamical Scattering; 5.5 Thermal Diffuse Scattering; 5.5.1 Approximations for Phonon Scattering; 5.6 Methods of Simulation for ADF Imaging; 5.6.1 Absorptive Potentials; 5.6.2 Frozen Phonon Approach; 5.7 Conclusions; 6 Details of STEM; 6.1 Signal to Noise Ratio and Some of its Implications 327 $a6.2 The Relationships Between Probe Size, Probe Current and Probe Angle6.2.1 The Geometric Model Revisited; 6.2.2 The Minimum Probe Size, the Optimum Angle and the Probe Current; 6.2.3 The Probe Current; 6.2.4 A Simple Approximation to Wave Optical Probe Size; 6.2.5 The Effect of Chromatic Aberration; 6.2.6 Choosing aopt in Practice; 6.2.7 The Effect of Making a Small Error in the Choice of aopt; 6.2.8 The Effect of a On the Diffraction Pattern; 6.2.9 Probe Spreading and Depth of Field; 6.3 The Condenser System; 6.4 The Scanning System; 6.4.1 Principles of the Scanning System 327 $a6.4.2 Implementation of the Scanning System 330 $a"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"--$cProvided by publisher. 330 $a"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"--$cProvided by publisher. 410 0$aRMS - Royal Microscopical Society 606 $aTransmission electron microscopy 606 $aAberration 606 $aAchromatism 615 0$aTransmission electron microscopy. 615 0$aAberration. 615 0$aAchromatism. 676 $a502.8/25 676 $a502.825 686 $aSCI053000$2bisacsh 701 $aBrydson$b Rik$01612811 701 $aBrooks$b Susan$01612812 712 02$aRoyal Microscopical Society (Great Britain) 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910822805803321 996 $aAberration-corrected analytical transmission electron microscopy$93941794 997 $aUNINA