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200 00$a10th anniversary compendium of papers from Asian Test Symposium : proceedings : 1992-2001
210 31$a[Place of publication not identified]$cIEEE Computer Society$d2001
300   $aBibliographic Level Mode of Issuance: Monograph
517 0 $aATS 2001 compendium
531   $aats
606   $aElectronic digital computers$xTesting$xCircuits$vCongresses
606   $aElectronic circuits$xTesting$vCongresses
606   $aFault-tolerant computing$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
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615  0$aElectronic digital computers$xTesting$xCircuits
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615  0$aFault-tolerant computing
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
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712 02$aIEEE Computer Society Test Technology Technical Committee
712 02$aAsian Test Symposium Tenth Anniversary Committee.
712 12$aAsian Test Symposium.
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996   $a10th anniversary compendium of papers from Asian Test Symposium : proceedings : 1992-2001$92361712
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