LEADER 01284oam  2200397zu 450 
001 996217171903316
005 20210807001457.0
010   $a1-4244-5598-7
035   $a(CKB)2670000000033746
035   $a(SSID)ssj0000452241
035   $a(PQKBManifestationID)12157752
035   $a(PQKBTitleCode)TC0000452241
035   $a(PQKBWorkID)10463614
035   $a(PQKB)11471003
035   $a(NjHacI)992670000000033746
035   $a(EXLCZ)992670000000033746
100   $a20160829d2010      uy              
101 0 $aeng
135   $aur|||||||||||
181   $ctxt
182   $cc
183   $acr
200 10$a2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
210 31$a[Place of publication not identified]$cI E E E$d2010
215   $a1 online resource
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a1-4244-5596-0 
606   $aIntegrated circuits$xTesting$vCongresses
615  0$aIntegrated circuits$xTesting
676   $a621.381548
702   $aIEEE Staff
801  0$bPQKB
906   $aPROCEEDING
912   $a996217171903316
996   $a2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits$92531676
997   $aUNISA