LEADER 01823nam  2200421   450 
001 996216505403316
005 20180302150416.0
010   $a1-5090-8441-X
035   $a(CKB)1000000000711226
035   $a(WaSeSS)IndRDA00093276
035   $a(EXLCZ)991000000000711226
100   $a20180302d2008      ||             |
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 14$aThe 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems $eproceedings : Boston, Massachusetts, 1-3 October 2008 /$fedited by Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, and Mohammad Tehranipoor ; sponsored by The IEEE Computer Society Test Technology Technical Council, The IEEE Computer Society Technical Committee on Fault Tolerant Computing
210  1$aNew York :$cIEEE,$d2008.
215   $a1 online resource (xxxi, 545 pages)
300   $aIncludes index.
311   $a0-7695-3365-5 
606   $aIntegrated circuits$xVery large scale integration$xDesign and construction$vCongresses
606   $aFault-tolerant computing$vCongresses
615  0$aIntegrated circuits$xVery large scale integration$xDesign and construction
615  0$aFault-tolerant computing
702   $aBolchini$b Cristiana
702   $aKim$b Yong-Bin
702   $aGizopoulos$b Dimitris
702   $aTehranipoor$b Mohammad H.$f1974-
712 02$aIEEE Computer Society.$bTechnical Council on Test Technology,
712 02$aIEEE Computer Society.$bFault-Tolerant Computing Technical Committee,
801  0$bWaSeSS
801  1$bWaSeSS
906   $aPROCEEDING
912   $a996216505403316
996   $aThe 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems$92352228
997   $aUNISA