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200 10$aDFT 2007 : 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy
210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d2007
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-2885-6 
606   $aIntegrated circuits$xDesign and construction$xVery large scale integration$vCongresses
606   $aFault-tolerant computing$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aElectrical Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aIntegrated circuits$xDesign and construction$xVery large scale integration
615  0$aFault-tolerant computing
615  7$aElectrical & Computer Engineering
615  7$aElectrical Engineering
615  7$aEngineering & Applied Sciences
676   $a621.39/5
702   $aBolchini$b Cristiana
712 02$aIEEE Computer Society
712 12$aIEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
801  0$bPQKB
906   $aPROCEEDING
912   $a996215563303316
996   $aDFT 2007 : 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 26-28 September, 2007, Rome, Italy$92357283
997   $aUNISA