LEADER 01277nam0-2200409---450- 001 990000431940203316 005 20100111141759.0 010 $a88-14-08726-1 035 $a0043194 035 $aUSA010043194 035 $a(ALEPH)000043194USA01 035 $a0043194 100 $a20010508d2001----km-y0itay0103----ba 101 $aita 102 $aIT 105 $a||||||||001yy 200 1 $a<> arbitri$emandato, responsabilità e funzioni$fAldo stesuri 210 $aMilano$cGiuffrè$dcopyr. 2001 215 $aXV, 179 p.$d24 cm 225 2 $a<> diritto privato oggi 410 0$12001$a<> diritto privato oggi 606 0 $aArbitrato 676 $a347.4509 700 1$aSTESURI,$bAldo$0149684 801 0$aIT$bsalbc$gISBD 912 $a990000431940203316 951 $aXXV.1. Coll. 1/ 87 (COLL. PBG 107)$b29191 G.$cXXV.1. Coll. 1/ 87 (COLL. PBG)$d00073170 959 $aBK 969 $aGIU 979 $aALESSANDRA$b40$c20010508$lUSA01$h0911 979 $aALESSANDRA$b40$c20010508$lUSA01$h0919 979 $c20020403$lUSA01$h1651 979 $aPATRY$b90$c20040406$lUSA01$h1630 979 $aCHIARA$b90$c20081014$lUSA01$h1308 979 $aRSIAV4$b90$c20100111$lUSA01$h1417 996 $aArbitri$9145253 997 $aUNISA LEADER 01824oam 2200469zu 450 001 996215080003316 005 20210807003547.0 035 $a(CKB)111026746726250 035 $a(SSID)ssj0000395389 035 $a(PQKBManifestationID)12129192 035 $a(PQKBTitleCode)TC0000395389 035 $a(PQKBWorkID)10450654 035 $a(PQKB)10132866 035 $a(EXLCZ)99111026746726250 100 $a20160829d1999 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$a1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998 210 31$a[Place of publication not identified]$cIEEE Electron Devices Society$d1999 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-7803-5649-7 606 $aIntegrated circuits$xReliability$vCongresses 606 $aIntegrated circuits$xReliability$xWafer-scale integration$vCongresses 606 $aElectrical & Computer Engineering$2HILCC 606 $aEngineering & Applied Sciences$2HILCC 606 $aElectrical Engineering$2HILCC 615 0$aIntegrated circuits$xReliability 615 0$aIntegrated circuits$xReliability$xWafer-scale integration 615 7$aElectrical & Computer Engineering 615 7$aEngineering & Applied Sciences 615 7$aElectrical Engineering 676 $a621.3815 712 02$aIEEE Reliability Society 712 02$aIEEE Electron Devices Society 712 12$aInternational Integrated Reliability Workshop 801 0$bPQKB 906 $aPROCEEDING 912 $a996215080003316 996 $a1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998$92540781 997 $aUNISA