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200 10$a1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998
210 31$a[Place of publication not identified]$cIEEE Electron Devices Society$d1999
300   $aBibliographic Level Mode of Issuance: Monograph
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615  7$aEngineering & Applied Sciences
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712 02$aIEEE Electron Devices Society
712 12$aInternational Integrated Reliability Workshop
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996   $a1999 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1998$92540781
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