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181   $ctxt
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183   $acr
200 10$a5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California
210 31$a[Place of publication not identified]$cIEEE Computer Society$d2004
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-2093-6 
606   $aIntegrated circuits$xVery large scale integration$xReliability$vCongresses
606   $aIntegrated circuits$xVery large scale integration$xDesign and construction$vCongresses
606   $aIntegrated circuits$xComputer-aided design$xVery large scale integration$vCongresses
606   $aIntegrated circuits$xQuality control$xVery large scale integration$xTesting$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIntegrated circuits$xVery large scale integration$xReliability
615  0$aIntegrated circuits$xVery large scale integration$xDesign and construction
615  0$aIntegrated circuits$xComputer-aided design$xVery large scale integration
615  0$aIntegrated circuits$xQuality control$xVery large scale integration$xTesting
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
712 02$aIEEE Electron Devices Society
712 12$aInternational Symposium on Quality Electronic Design
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906   $aPROCEEDING
912   $a996214938303316
996   $a5th International Symposium on Quality Electronic Design : proceedings : 22-24 March, 2004, San Jose, California$92418279
997   $aUNISA