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200 10$a1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994
210 31$a[Place of publication not identified]$cIEEE Electron Devices Society$d1994
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-1908-7 
606   $aIntegrated circuits$xReliability$xCongresses
606   $aIntegrated circuits$xReliability$xCongresses$xWafer scale integration
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIntegrated circuits$xReliability$xCongresses
615  0$aIntegrated circuits$xReliability$xCongresses$xWafer scale integration
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.3815/2
712 02$aIEEE Reliability Society
712 02$aIEEE Electron Devices Society
712 12$aInternational Integrated Reliability Workshop
801  0$bPQKB
906   $aBOOK
912   $a996214351703316
996   $a1994 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994$92524679
997   $aUNISA