LEADER 01641oam  2200457zu 450 
001 996214346903316
005 20210807003446.0
035   $a(CKB)111026746710498
035   $a(SSID)ssj0000450944
035   $a(PQKBManifestationID)12168891
035   $a(PQKBTitleCode)TC0000450944
035   $a(PQKBWorkID)10459515
035   $a(PQKB)11411937
035   $a(EXLCZ)99111026746710498
100   $a20160829d1994      uy              
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$aProceedings - International Test Conference (25th : 1994 : Washington D.C)
210 31$a[Place of publication not identified]$cThe Conference$d1994
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-2103-0 
606   $aIntegrated circuits$xTesting$xCongresses
606   $aElectronic digital computers$xTesting$xCongresses$xCircuits
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIntegrated circuits$xTesting$xCongresses
615  0$aElectronic digital computers$xTesting$xCongresses$xCircuits
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.3815/48
712 02$aInstitute of Electrical and Electronics Engineers
712 12$aInternational Test Conference
801  0$bPQKB
906   $aBOOK
912   $a996214346903316
996   $aProceedings - International Test Conference (25th : 1994 : Washington D.C)$92508023
997   $aUNISA