LEADER 01169nam0-22004091i-450- 001 990005512680203316 005 20031027120000.0 035 $a000551268 035 $aUSA01000551268 035 $a(ALEPH)000551268USA01 035 $a000551268 100 $a20031027d2002-------|0itac50------ba 101 $aita 102 $aIT 105 $a||||I ||||| 200 1 $aCause di morte$eanno 1999$fIstat 210 $aRoma$cIstat$d2002 215 $a385 p.$d25 cm.$eappendice 225 2$aAnnuari$v15 311 $a2002$9USA5600 410 0$12001$aAnnuari$v15 606 $aMortalità$xItalia$2FI 620 $dRoma 676 $a304.64021$cPopolazione - decessi (mortalità) statistiche generali$v21 710 02$aIstituto centrale di statistica$0374421 712 $aistat 801 $aIT$bSOL$c20120104 912 $a990005512680203316 950 $aDIP.TO SCIENZE ECONOMICHE - (SA)$dDS 300 304.64021 ist$e2002 DISES 951 $a300 304.64021 ist$b569 DISES 959 $aBK 969 $aDISES 979 $c20121027$lUSA01$h1532 979 $c20121027$lUSA01$h1613 996 $aCause di morte$9737719 997 $aUNISA NUM $aUSA12421 LEADER 02192oam 2200553zu 450 001 996212593703316 005 20210807003355.0 035 $a(CKB)111026746722772 035 $a(SSID)ssj0000395085 035 $a(PQKBManifestationID)12154915 035 $a(PQKBTitleCode)TC0000395085 035 $a(PQKBWorkID)10449853 035 $a(PQKB)10646649 035 $a(EXLCZ)99111026746722772 100 $a20160829d1998 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$a1998 Fourth International High Temperature Electronics Conference : HITEC, Albuquerque, New Mexico, USA, June 14-18, 1998 210 31$a[Place of publication not identified]$cThe Institute of Electrical and Electronics Engineers Inc$d1998 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-7803-4540-1 606 $aElectronics$xMaterials$xCongresses 606 $aHeat resistant materials$vCongresses 606 $aSilicon-on-insulator technology$xCongresses 606 $aField-effect transistors$xCongresses 606 $aGallium arsenide$xCongresses 606 $aElectrical & Computer Engineering$2HILCC 606 $aEngineering & Applied Sciences$2HILCC 606 $aElectrical Engineering$2HILCC 615 0$aElectronics$xMaterials$xCongresses 615 0$aHeat resistant materials 615 0$aSilicon-on-insulator technology$xCongresses 615 0$aField-effect transistors$xCongresses 615 0$aGallium arsenide$xCongresses 615 7$aElectrical & Computer Engineering 615 7$aEngineering & Applied Sciences 615 7$aElectrical Engineering 676 $a621.381/04 712 02$aAir Force Research Laboratory (Wright-Patterson Air Force Base, Ohio) 712 02$aIEEE Electron Devices Society 712 02$aComponents, Packaging & Manufacturing Technology Society 712 12$aInternational High Temperature Electronics Conference 801 0$bPQKB 906 $aPROCEEDING 912 $a996212593703316 996 $a1998 Fourth International High Temperature Electronics Conference : HITEC, Albuquerque, New Mexico, USA, June 14-18, 1998$92507918 997 $aUNISA