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200 10$a1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997
210 31$a[Place of publication not identified]$cIEEE Electron Devices Society$d1997
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-4205-4 
606   $aIntegrated circuits$xReliability$xCongresses
606   $aIntegrated circuits$xCongresses$xReliability$xWafer-scale integration
606   $aElectrical & Computer Engineering$2HILCC
606   $aElectrical Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aIntegrated circuits$xReliability$xCongresses
615  0$aIntegrated circuits$xCongresses$xReliability$xWafer-scale integration
615  7$aElectrical & Computer Engineering
615  7$aElectrical Engineering
615  7$aEngineering & Applied Sciences
676   $a621.3815
712 02$aIEEE Reliability Society
712 02$aIEEE Electron Devices Society
712 12$aInternational Integrated Reliability Workshop
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912   $a996212474703316
996   $a1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997$92539629
997   $aUNISA