LEADER 01714oam 2200505zu 450 001 996212474403316 005 20210807003358.0 010 $a0-7803-4210-0 035 $a(CKB)111026746720558 035 $a(SSID)ssj0000455199 035 $a(PQKBManifestationID)12150313 035 $a(PQKBTitleCode)TC0000455199 035 $a(PQKBWorkID)10399569 035 $a(PQKB)10788202 035 $a(EXLCZ)99111026746720558 100 $a20160829d1997 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$aProceedings 210 31$a[Place of publication not identified]$cThe Conference$d1997 300 $aBibliographic Level Mode of Issuance: Monograph 517 $aInternational Test Conference 1997 531 $aitc 531 $aPROCEEDINGS 606 $aIntegrated circuits$xCongresses$xTesting 606 $aElectronic digital computers$xTesting$xCongresses$xCircuits 606 $aElectrical & Computer Engineering$2HILCC 606 $aElectrical Engineering$2HILCC 606 $aEngineering & Applied Sciences$2HILCC 615 0$aIntegrated circuits$xCongresses$xTesting 615 0$aElectronic digital computers$xTesting$xCongresses$xCircuits 615 7$aElectrical & Computer Engineering 615 7$aElectrical Engineering 615 7$aEngineering & Applied Sciences 676 $a621.3815/48 712 02$aIEEE Computer Society Test Technology Technical Committee 712 02$aInstitute of Electrical and Electronics Engineers Philadelphia Section. 712 12$aInternational Test Conference 801 0$bPQKB 906 $aPROCEEDING 912 $a996212474403316 996 $aProceedings$957126 997 $aUNISA