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101 0 $aeng
181   $ctxt
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183   $acr
200 10$aProceedings International Test Conference 2002
210 31$a[Place of publication not identified]$cInternational Test Conference$d2002
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-7542-4 
606   $aIntegrated circuits$xTesting$vCongresses
606   $aElectronic digital computers$xTesting$xCircuits$vCongresses
606   $aTelecommunication$vCongresses
606   $aRadio frequency$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIntegrated circuits$xTesting
615  0$aElectronic digital computers$xTesting$xCircuits
615  0$aTelecommunication
615  0$aRadio frequency
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.3815/48
712 02$aIEEE Computer Society Test Technology Technical Committee
712 02$aInstitute of Electrical and Electronics Engineers Philadelphia Section.
712 12$aInternational Test Conference
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912   $a996211258803316
996   $aProceedings International Test Conference 2002$92506427
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