LEADER 01168nam 2200337 450 001 996211254003316 005 20180228150422.0 035 $a(CKB)111055184257866 035 $a(WaSeSS)IndRDA00092904 035 $a(EXLCZ)99111055184257866 100 $a20180228d2002 || | 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$a2001 GaAs Reliability Workshop $eproceedings : October 21, 2001, Baltimore, Maryland /$fsponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards 210 1$aNew York :$cIEEE,$d2002. 215 $a1 online resource (222 pages) 311 $a0-7908-0066-7 606 $aGallium arsenide semiconductors$vCongresses 606 $aSemiconductors$xReliability$vCongresses 615 0$aGallium arsenide semiconductors 615 0$aSemiconductors$xReliability 712 02$aJEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards, 801 0$bWaSeSS 801 1$bWaSeSS 906 $aPROCEEDING 912 $a996211254003316 996 $a2001 GaAs Reliability Workshop$92509187 997 $aUNISA