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183   $acr
200 10$a1999 GaAs Reliability Workshop : proceedings : October 17, 1999, Monterey, California
210 31$a[Place of publication not identified]$cIEEE$d1999
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7908-0100-0 
606   $aGallium arsenide semiconductors$xReliability$vCongresses
606   $aSemiconductors$xMaterials$vCongresses
606   $aSemiconductors$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aGallium arsenide semiconductors$xReliability
615  0$aSemiconductors$xMaterials
615  0$aSemiconductors
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.3815/2
712 02$aIEEE Electron Devices Society
712 02$aJEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
712 12$aGaAs Reliability Workshop
801  0$bPQKB
906   $aPROCEEDING
912   $a996211253903316
996   $a1999 GaAs Reliability Workshop : proceedings : October 17, 1999, Monterey, California$92505370
997   $aUNISA