LEADER 01882nam 2200469 450 001 996210895103316 005 20160803134623.0 035 $a(CKB)1000000000021679 035 $a(SSID)ssj0000395462 035 $a(PQKBManifestationID)12155180 035 $a(PQKBTitleCode)TC0000395462 035 $a(PQKBWorkID)10455241 035 $a(PQKB)10317865 035 $a(WaSeSS)IndRDA00123784 035 $a(EXLCZ)991000000000021679 100 $a20200527d2003 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$aMSE '03 $e2003 IEEE International Conference on Microelectronic Systems Education : proceedings : June 1-2, 2003, Anaheim, California, USA /$fsponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI 210 1$aLos Alamitos, California :$cIEEE Computer Society,$d2003. 215 $a1 online resource (159 pages) 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-7695-1973-3 606 $aMicroelectronics$xStudy and teaching$vCongresses 606 $aComputer science$xStudy and teaching$vCongresses 608 $aElectronic books. 615 0$aMicroelectronics$xStudy and teaching 615 0$aComputer science$xStudy and teaching 676 $a621.381071 712 02$aIEEE Computer Society.$bDesign Automation Technical Committee, 712 02$aIEEE Computer Society.$bTest Technology Technical Committee, 712 02$aIEEE Computer Society.$bTechnical Committee on VLSI, 712 12$aIEEE International Conference on Microelectronic Systems Education 801 0$bWaSeSS 801 1$bWaSeSS 906 $aPROCEEDING 912 $a996210895103316 996 $aMSE '03$92352111 997 $aUNISA