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101 0 $aeng
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183   $acr
200 10$aProceedings, 9th IEEE International On-Line Testing Symposium : IOLTS 2003, 7-9 July 2003, Kos International Convention Center, Kos Island, Greece
210 31$a[Place of publication not identified]$cIEEE Computer Society$d2003
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-1968-7 
606   $aElectronic circuits$xTesting$xData processing$vCongresses
606   $aError-correcting codes (Information theory)$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aElectronic circuits$xTesting$xData processing
615  0$aError-correcting codes (Information theory)
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.3815/48
702   $aMetra$b C
712 02$aIEEE Computer Society Technical Council on Test Technology.
712 12$aIEEE International On-Line Testing Symposium
801  0$bPQKB
906   $aPROCEEDING
912   $a996210745003316
996   $aProceedings, 9th IEEE International On-Line Testing Symposium : IOLTS 2003, 7-9 July 2003, Kos International Convention Center, Kos Island, Greece$92389413
997   $aUNISA