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200 10$aNineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 2003
210 31$a[Place of publication not identified]$cIEEE$d2003
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-7793-1 
606   $aSemiconductors$xThermal properties$vCongresses
606   $aSemiconductors$xCooling$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aSemiconductors$xThermal properties
615  0$aSemiconductors$xCooling
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
712 02$aIEEE Components, Hybrids, and Manufacturing Technology Society
712 12$aIEEE Semiconductor Thermal Measurement and Management Symposium
801  0$bPQKB
906   $aPROCEEDING
912   $a996210044003316
996   $aNineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 2003$92524910
997   $aUNISA