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200 10$a2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings
210 31$a[Place of publication not identified]$cInstitute of Electrical and Electronics Engineers$d2006
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-9726-6 
606   $aIntegrated circuits$xDesign and construction$vCongresses
606   $aIntegrated circuits$xTesting$vCongresses
606   $aNanotechnology$xDesign$vCongresses
606   $aMicroelectronics$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aElectrical Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aIntegrated circuits$xDesign and construction
615  0$aIntegrated circuits$xTesting
615  0$aNanotechnology$xDesign
615  0$aMicroelectronics
615  7$aElectrical & Computer Engineering
615  7$aElectrical Engineering
615  7$aEngineering & Applied Sciences
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712 12$aInternational Conference on Design & Test of Integrated Systems in Nanoscale Technology
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912   $a996207484803316
996   $a2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings$92506700
997   $aUNISA