LEADER 01184nam  2200373   450 
001 996206597303316
005 20180306125620.0
010   $a1-5090-7541-0
035   $a(CKB)2400000000002488
035   $a(WaSeSS)IndRDA00093562
035   $a(EXLCZ)992400000000002488
100   $a20180306d2009      ||             |
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aATS 2009 $eproceedings : 2009 Asian Test Symposium : 23-26 November 2009, Taichung, Taiwan
210  1$aNew York :$cIEEE,$d2009.
215   $a1 online resource (xxv, 465 pages)
300   $aIncludes index.
311   $a0-7695-3864-9 
606   $aElectronic circuits$xTesting$vCongresses
606   $aElectronic digital computers$xCircuits$xTesting$vCongresses
606   $aFault-tolerant computing$vCongresses
615  0$aElectronic circuits$xTesting
615  0$aElectronic digital computers$xCircuits$xTesting
615  0$aFault-tolerant computing
801  0$bWaSeSS
801  1$bWaSeSS
906   $aPROCEEDING
912   $a996206597303316
996   $aATS 2009$92307213
997   $aUNISA