LEADER 01721oam  2200493zu 450 
001 996206260603316
005 20210807000231.0
035   $a(CKB)1000000000022782
035   $a(SSID)ssj0000396258
035   $a(PQKBManifestationID)12128069
035   $a(PQKBTitleCode)TC0000396258
035   $a(PQKBWorkID)10460596
035   $a(PQKB)11623917
035   $a(EXLCZ)991000000000022782
100   $a20160829d2004      uy              
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$a2004 ROCS Workshop : proceedings : October 24, 2004, Monterey, California
210 31$a[Place of publication not identified]$cJEDEC$d2004
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7908-0105-1 
606   $aGallium arsenide semiconductors$xReliability$vCongresses
606   $aSemiconductors$xMaterials$vCongresses
606   $aSemiconductors$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aGallium arsenide semiconductors$xReliability
615  0$aSemiconductors$xMaterials
615  0$aSemiconductors
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.3815/2
712 02$aJEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
712 02$aIEEE Electron Devices Society
712 12$aROCS Workshop
801  0$bPQKB
906   $aPROCEEDING
912   $a996206260603316
996   $a2004 ROCS Workshop : proceedings : October 24, 2004, Monterey, California$92513464
997   $aUNISA