LEADER 02467nas 2200637-a 450 001 996205069103316 005 20240202213016.0 011 $a1942-9401 035 $a(OCoLC)135066057 035 $a(CKB)991042723557704 035 $a(CONSER)--2007242231 035 $a(EXLCZ)99991042723557704 100 $a20070524b20032016 s-- a 101 0 $aeng 135 $aurcn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aProceedings /$fIEEE International On-Line Testing Symposium 210 $aLos Alamitos, Calif. $cIEEE Computer Society$dİ2003- 300 $aTitle from PDF of original t.p. (IEEE Xplore, viewed May 24, 2007). 311 $a1530-1591 517 3 $aIOLTS 531 $aDESIGN, AUTOMATION, AND TEST IN EUROPE CONFERENCE AND EXHIBITION 531 $aDESIGN, AUTOMATION, AND TEST IN EUROPE 531 $aPROCEEDINGS - DESIGN, AUTOMATION, AND TEST IN EUROPE CONFERENCE & EXHIBITION 531 $aPROCEEDINGS - DESIGN, AUTOMATION, & TEST IN EUROPE CONFERENCE & EXHIBITION 531 $aDATE 531 $aDATE: DESIGN, AUTOMATION, & TEST IN EUROPE 531 $aIEEE SYMPOSIUM ON-LINE TESTING 531 0 $aProc. 606 $aElectronic circuits$xTesting$vCongresses 606 $aOnline data processing$vCongresses 606 $aElectronic circuit design$vCongresses 606 $aError-correcting codes (Information theory)$vCongresses 606 $aElectronic circuit design$2fast$3(OCoLC)fst00906862 606 $aElectronic circuits$xTesting$2fast$3(OCoLC)fst00906898 606 $aError-correcting codes (Information theory)$2fast$3(OCoLC)fst00915036 606 $aOnline data processing$2fast$3(OCoLC)fst01045942 608 $aPeriodicals.$2fast 608 $aConference papers and proceedings.$2fast 615 0$aElectronic circuits$xTesting 615 0$aOnline data processing 615 0$aElectronic circuit design 615 0$aError-correcting codes (Information theory) 615 7$aElectronic circuit design. 615 7$aElectronic circuits$xTesting. 615 7$aError-correcting codes (Information theory) 615 7$aOnline data processing. 676 $a621 712 02$aInstitute of Electrical and Electronics Engineers. 712 02$aIEEE Computer Society.$bTechnical Council on Test Technology. 906 $aCONFERENCE 912 $a996205069103316 996 $aProceedings$957126 997 $aUNISA