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100   $a20200602d1996      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt
182   $cc
183   $acr
200 10$aATS '96 $eproceedings of the Fifth Asian Test Symposium : November 20-22, 1996, Hsinchu, Taiwan /$fsponsored by the IEEE Computer Society Technical Committee on Test Technology -- Asia Subcommittee, National Tsing Hua University
210  1$aLos Alamitos, California :$cIEEE Computer Society,$d1996.
215   $a1 online resource (154 pages)
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-8186-7478-4 
606   $aElectronic digital computers$xCircuits$xTesting$vCongresses
606   $aElectronic circuits$xTesting$vCongresses
606   $aFault-tolerant computing$vCongresses
615  0$aElectronic digital computers$xCircuits$xTesting
615  0$aElectronic circuits$xTesting
615  0$aFault-tolerant computing
676   $a62
712 02$aIEEE Computer Society.$bTest Technology Technical Committee.$bAsia Subcommittee,
801  0$bWaSeSS
801  1$bWaSeSS
906   $aBOOK
912   $a996204935103316
996   $aATS '96$92338175
997   $aUNISA