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183   $acr
200 10$a2006 International SiGe Technology and Device Meeting : Princeton University, Princeton, NJ, USA, May 15th-May 17th, 2006
210 31$a[Place of publication not identified]$cIEEE$d2006
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a1-4244-0461-4 
606   $aSilicon alloys$xMaterials$vCongresses
606   $aGermanium alloys$vCongresses
606   $aSemiconductors$vCongresses
606   $aIntegrated circuits$vCongresses
606   $aElectrical Engineering$2HILCC
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aSilicon alloys$xMaterials
615  0$aGermanium alloys
615  0$aSemiconductors
615  0$aIntegrated circuits
615  7$aElectrical Engineering
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
712 02$aAmerican Vacuum Society
712 02$aInstitute of Electrical and Electronics Engineers
712 12$aInternational SiGe Technology and Device Meeting
801  0$bPQKB
906   $aPROCEEDING
912   $a996204934303316
996   $a2006 International SiGe Technology and Device Meeting : Princeton University, Princeton, NJ, USA, May 15th-May 17th, 2006$92505381
997   $aUNISA