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183   $acr
200 10$a2004 1st IEEE Lightwave Technologies in Instrumentation and Measurement Conference : Palisades, NY, 19-20 October, 2004
210 31$a[Place of publication not identified]$cIEEE$d2004
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-8723-6 
311   $a0-7803-8722-8 
606   $aElectrooptics$vCongresses
606   $aElectrooptical devices$vCongresses
606   $aPhotometry$vCongresses
606   $aOptical measurements$vCongresses
606   $aEngineering & Applied Sciences$2HILCC
606   $aApplied Physics$2HILCC
615  0$aElectrooptics
615  0$aElectrooptical devices
615  0$aPhotometry
615  0$aOptical measurements
615  7$aEngineering & Applied Sciences
615  7$aApplied Physics
676   $a621.381/045
712 02$aIEEE Metropolitan Sections Activities Council
712 12$aIEEE Lightwave Technologies in Instrumentation and Measurement Conference
801  0$bPQKB
906   $aPROCEEDING
912   $a996204500203316
996   $a2004 1st IEEE Lightwave Technologies in Instrumentation and Measurement Conference : Palisades, NY, 19-20 October, 2004$92539082
997   $aUNISA