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101 0 $aeng
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200 10$a1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995
210 31$a[Place of publication not identified]$cIEEE Electron Devices Society$d1996
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-2705-5 
606   $aIntegrated circuits$xCongresses$xReliability
606   $aIntegrated circuits$xReliability$xWafer scale integration$xCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aElectrical Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aIntegrated circuits$xCongresses$xReliability
615  0$aIntegrated circuits$xReliability$xWafer scale integration$xCongresses
615  7$aElectrical & Computer Engineering
615  7$aElectrical Engineering
615  7$aEngineering & Applied Sciences
676   $a621.3815
712 02$aIEEE Electron Devices Society
712 02$aIEEE Reliability Society
712 12$aInternational Integrated Reliability Workshop
801  0$bPQKB
906   $aBOOK
912   $a996204469603316
996   $a1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995$92531430
997   $aUNISA