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101 0 $aeng
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181   $ctxt
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183   $acr
200 00$aIEEE Autotestcon 2005
210 31$a[Place of publication not identified]$cI E E E$d2005
215   $a1 online resource (xxvii, 867 pages) $cillustrations
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-9101-2 
606   $aElectronic digital computers$xTesting$vCongresses
606   $aSystems engineering$vCongresses
606   $aWeapons systems$xTechnological innovations
606   $aWeapons systems$xTechnological innovations$vCongresses
615  0$aElectronic digital computers$xTesting
615  0$aSystems engineering
615  0$aWeapons systems$xTechnological innovations.
615  0$aWeapons systems$xTechnological innovations
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996   $aIEEE Autotestcon 2005$92501374
997   $aUNISA