LEADER 01616oam  2200445zu 450 
001 996203705803316
005 20210807003354.0
035   $a(CKB)111026746716114
035   $a(SSID)ssj0000455255
035   $a(PQKBManifestationID)12150315
035   $a(PQKBTitleCode)TC0000455255
035   $a(PQKBWorkID)10398358
035   $a(PQKB)11188749
035   $a(EXLCZ)99111026746716114
100   $a20160829d1996      uy              
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$a1996 IEEE Radiation Effects Data Workshop : workshop record
210 31$a[Place of publication not identified]$cInstitute of Electrical and Electronics Engineers$d1996
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-3398-5 
606   $aElectronic apparatus and appliances$xCongresses$xEffect of radiation on
606   $aElectrical & Computer Engineering$2HILCC
606   $aElectrical Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aElectronic apparatus and appliances$xCongresses$xEffect of radiation on
615  7$aElectrical & Computer Engineering
615  7$aElectrical Engineering
615  7$aEngineering & Applied Sciences
676   $a621.381
712 02$aIEEE Nuclear and Plasma Sciences Society
712 02$aInstitute of Electrical and Electronics Engineers
712 12$aIEEE Radiation Effects Data Workshop
801  0$bPQKB
906   $aBOOK
912   $a996203705803316
996   $a1996 IEEE Radiation Effects Data Workshop : workshop record$92512700
997   $aUNISA