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181   $ctxt
182   $cc
183   $acr
200 10$aInternational Symposium on Quality Electronic Design : proceedings, 26-28 March, 2001, San Jose, California
210 31$a[Place of publication not identified]$cIEEE Computer Society$d2001
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-1025-6 
606   $aIntegrated circuits$xReliability$xVery large scale integration$vCongresses
606   $aIntegrated circuits$xDesign and construction$xVery large scale integration$vCongresses
606   $aIntegrated circuits$xComputer-aided design$xVery large scale integration$vCongresses
606   $aIntegrated circuits$xTesting$xVery large scale integration$xQuality control$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIntegrated circuits$xReliability$xVery large scale integration
615  0$aIntegrated circuits$xDesign and construction$xVery large scale integration
615  0$aIntegrated circuits$xComputer-aided design$xVery large scale integration
615  0$aIntegrated circuits$xTesting$xVery large scale integration$xQuality control
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.39/5
712 02$aIEEE Computer Society
801  0$bPQKB
906   $aPROCEEDING
912   $a996203396803316
996   $aInternational Symposium on Quality Electronic Design : proceedings, 26-28 March, 2001, San Jose, California$92400336
997   $aUNISA